The Supervisory Board of Carl Zeiss AG has appointed Bronwyn Brophy O’Connor as the new Executive Board Member of Carl Zeiss AG responsible for the Medical Technology ... The German Society of ...

ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see ...

Zeiss has unveiled the new Zeiss Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM), optimised for demanding sample preparation. It can provide a live, high-resolution “see while ...

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...

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TeamPCP, the threat actor behind the recent compromises of Trivy and KICS, has now compromised a popular Python package named litellm, pushing two malicious versions containing a credential harvester, ...

The ZEISS Panoptes 65 is a new lens set inspired by ZEISS’ modern full-frame lenses and will cover the larger sensor area of the Alexa 265, Alexa 65, Blackmagic URSA Cine 17K 65, etc. There will be 10 ...

Abstract: The introduction of automated process inspection (API) system using in-line SEMVision was applied to monitor the contact process of the inter layer dielectric (ILD). The conventional optical ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

At SEMICON Taiwan 2025, Zeiss Semiconductor Manufacturing Technology offered a rare glimpse into the future of extreme ultraviolet (EUV) lithography, outlining its optics roadmap from High NA to the ...